Ramey LLP wishes to congratulate its client Credo Semiconductor on issuance of US Pat. 11,035,900, titled SCAN-CHAIN TESTING VIA DESERIALIZER PORT.  This patent relates to the use of a deserializer port for high-speed scan-chain testing of a semiconductor chip, enabling chip testing to be performed more quickly and/or more thoroughly.  This design feature can be integrated into Credo's SerDes IP Cores, enhancing their value to chip designers and manufacturers.

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